4299 search results - page 159 / 860 » Concurrent Test Generation |
120
click to vote
ICCD
2002
IEEE
16 years 15 days ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
118
Voted
CEC
2007
IEEE
15 years 10 months ago
2007
IEEE
— One of the main tasks software testing involves is the generation of the test cases to be used during the test. Due to its expensive cost, the automation of this task has becom...
145
Voted
UML
2004
Springer
15 years 9 months ago
2004
Springer
We describe the tools and interfaces created by the AGEDIS project, a European Commission sponsored project for the creation of a methodology and tools for automated model driven ...
124
Voted
VTS
1997
IEEE
15 years 7 months ago
1997
IEEE
A new approach for testing the bistable elements (latches and flip-flops) in scan chain circuits is presented. In this approach, we generate test patterns that apply a checking ex...
112
Voted
JSS
2008
15 years 3 months ago
2008
Search-based test-data generation has proved successful for code-level testing but almost no search-based work has been carried out at evels of abstraction. In this paper the appl...