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ICCAD
2000
IEEE
15 years 8 months ago
2000
IEEE
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
143
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JCP
2008
15 years 3 months ago
2008
- Our paper focuses on the generation of optimal test sequences and test cases using Intelligent Agents for highly reliable systems. Test sequences support test case generation for...
130
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APSEC
2005
IEEE
15 years 9 months ago
2005
IEEE
We describe the “STSC” prototype tool that supports the statistical testing of software components. The tool supports a wide range of operational profiles and test oracles for...
129
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IJSEKE
2006
15 years 3 months ago
2006
hibiting the characteristics of abstraction, encapsulation, genericity, inheritance, polymorphism, concurrency and exception handling. To address the difficulty of testing the feat...
122
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VTS
2007
IEEE
15 years 10 months ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...