4299 search results - page 171 / 860 » Concurrent Test Generation |
156
Voted
AADEBUG
2005
Springer
15 years 5 months ago
2005
Springer
In a C compiler, function calls are difficult to implement correctly because they must respect a platform-specific calling convention. But they are governed by a simple invariant...
143
Voted
ICSEA
2006
IEEE
15 years 9 months ago
2006
IEEE
— This paper describes an innovative approach to network testing based on automatically generating and analyzing state machine models of network behavior. The models are generate...
142
Voted
RSP
2003
IEEE
15 years 9 months ago
2003
IEEE
Model-based testing relies on the use of behavior models to automatically generate sequences of inputs and expected outputs. These sequences can be used as test cases to the end o...
126
Voted
ICCAD
2000
IEEE
15 years 8 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
138
Voted
ICCD
2006
IEEE
16 years 17 days ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...