4299 search results - page 172 / 860 » Concurrent Test Generation |
122
Voted
ISQED
2007
IEEE
15 years 10 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
162
Voted
FPGA
2000
ACM
15 years 7 months ago
2000
ACM
A method for evaluating and constructing sparse crossbars which are both area efficient and highly routable is presented. The evaluation method uses a network flow algorithm to ac...
114
Voted
TACAS
2009
Springer
15 years 10 months ago
2009
Springer
We describe the design and implementation of an automatic invariant generator for imperative programs. While automatic invariant generation through constraint solving has been exte...
114
Voted
ATS
2000
IEEE
15 years 8 months ago
2000
IEEE
We present a new pseudorandom testing algorithm for the Built-In Self-Test (BIST) of DRAM. In this algorithm, test patterns are complemented to generate state-transitions that are...
140
Voted
GI
2007
Springer
15 years 9 months ago
2007
Springer
: A strategy for automatic test case selection based on the use of a similarity function is presented. Test case selection is a crucial activity to model-based testing since the nu...