4299 search results - page 173 / 860 » Concurrent Test Generation |
135
Voted
SEW
2006
IEEE
15 years 9 months ago
2006
IEEE
Pseudo-exhaustive testing uses the empirical observation that, for broad classes of software, a fault is likely triggered by only a few variables interacting. The method takes adv...
136
Voted
PKC
1999
Springer
15 years 8 months ago
1999
Springer
Abstract. Many applications rely on the security of their random number generator. It is therefore essential that such devices be extensively tested for malfunction. The purpose of...
146
Voted
ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
121
Voted
COMPSAC
2006
IEEE
15 years 9 months ago
2006
IEEE
Web applications have become complex and crucial in many fields. In order to assure their quality, a high demand for systematic methodologies of Web application testing is emergin...
120
Voted
MTDT
2000
IEEE
15 years 8 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...