4299 search results - page 183 / 860 » Concurrent Test Generation |
77
Voted
ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] te...
101
click to vote
DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...
138
Voted
PTS
2010
15 years 2 months ago
2010
We present an application of learning-based testing to the problem of automated test case generation (ATCG) for numerical software. Our approach uses n-dimensional polynomial model...
121
Voted
ITC
1995
IEEE
15 years 7 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
150
Voted
SIGMOD
2011
ACM
14 years 6 months ago
2011
ACM
We study the problem of generating synthetic databases having declaratively specified characteristics. This problem is motivated by database system and application testing, data ...