4299 search results - page 195 / 860 » Concurrent Test Generation |
141
Voted
KBSE
2010
IEEE
15 years 2 months ago
2010
IEEE
Although testing is central to debugging and software certification, there is no adequate language to specify test suites over source code. Such a language should be simple and c...
125
Voted
SIGSOFT
2005
ACM
16 years 4 months ago
2005
ACM
In unit testing, a program is decomposed into units which are collections of functions. A part of unit can be tested by generating inputs for a single entry function. The entry fu...
130
Voted
ICSE
2009
IEEE-ACM
15 years 8 months ago
2009
IEEE-ACM
In ICSE’08 we demonstrated the Java UML Lightweight Enumerator (JULE) tool, which supports compliance test generation from modeling standards specifications. When employed in ou...
123
Voted
DAC
2005
ACM
15 years 5 months ago
2005
ACM
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
158
Voted
ICST
2010
IEEE
15 years 2 months ago
2010
IEEE
—In this case study we test a landing gear control system of a military aircraft with the new version of LUTESS, a tool for testing automatically synchronous software. LUTESS req...