4299 search results - page 198 / 860 » Concurrent Test Generation |
117
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ISVC
2007
Springer
15 years 10 months ago
2007
Springer
This paper presents a technique that allows test engineers to visually analyze and explore within memory chip test data. We represent the test results from a generation of chips al...
108
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DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
125
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HICSS
2003
IEEE
15 years 9 months ago
2003
IEEE
Statistical testing of software based on a usage model is a cost-effective and efficient means to make inferences about software quality. In order to apply this method, a usage m...
125
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VTS
1997
IEEE
15 years 8 months ago
1997
IEEE
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
123
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ACSAC
2003
IEEE
15 years 9 months ago
2003
IEEE
This paper reports an experiment aimed at generating synthetic test data for fraud detection in an IP based videoon-demand service. The data generation verifies a methodology pre...