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ITNG
2008
IEEE
15 years 10 months ago
Combinatorial Test Case Selection with Markovian Usage Models
A method of using Markov chain techniques for combinatorial test case selection is presented. The method can be used for statistical and coverage testing of many software programs...
Sergiy A. Vilkomir, W. Thomas Swain, Jesse H. Poor...
ICCAD
1998
IEEE
96views Hardware» more  ICCAD 1998»
15 years 8 months ago
Test set compaction algorithms for combinational circuits
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
Ilker Hamzaoglu, Janak H. Patel
ICECCS
2000
IEEE
106views Hardware» more  ICECCS 2000»
15 years 7 months ago
Evaluation of Three Specification-Based Testing Criteria
This paper compares three specification-based testing criteria using Mathur and Wong's PROBSUBSUMES measure. The three criteria are specification-mutation coverage, full pred...
Aynur Abdurazik, Paul Ammann, Wei Ding 0003, A. Je...
ICSE
2005
IEEE-ACM
16 years 3 months ago
Testing database transactions with AGENDA
AGENDA is a tool set for testing relational database applications. An earlier prototype was targeted to applications consisting of a single query and included components for popul...
Yuetang Deng, Phyllis G. Frankl, David Chays
102
Voted
AIS
2004
Springer
15 years 7 months ago
Timed I/O Test Sequences for Discrete Event Model Verification
Abstract. Model verification examines the correctness of a model implementation with respect to a model specification. While being described from model specification, implementatio...
Ki Jung Hong, Tag Gon Kim