4299 search results - page 220 / 860 » Concurrent Test Generation |
139
click to vote
ICCAD
1999
IEEE
15 years 8 months ago
1999
IEEE
This paper presents a new method to synthesize timed asynchronous circuits directly from the specification without generating a state graph. The synthesis procedure begins with a ...
204
click to vote
ESEC
1999
Springer
15 years 8 months ago
1999
Springer
CIP is a model-based software development method for embedded systems. The problem of constructing an embedded system is decomposed into a functional and a connection problem. The ...
131
Voted
CONCURRENCY
2008
15 years 4 months ago
2008
Our research focuses on creating and executing large-scale scientific workflows that often involve thousands of computations over distributed, shared resources. We describe an app...
113
click to vote
EUROPAR
2004
Springer
15 years 9 months ago
2004
Springer
The APART working group is developing the APART Test Suite (ATS) for evaluating (automatic) performance analysis tools with respect to their correctness – that is, their ability...
192
Voted
ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture A...