4299 search results - page 222 / 860 » Concurrent Test Generation |
217
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ICST
2011
IEEE
14 years 7 months ago
2011
IEEE
—The length of test cases is a little investigated topic in search-based test generation for object oriented software, where test cases are sequences of method calls. While intui...
130
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KBSE
2005
IEEE
15 years 9 months ago
2005
IEEE
Test factoring creates fast, focused unit tests from slow system-wide tests; each new unit test exercises only a subset of the functionality exercised by the system test. Augmenti...
131
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VTS
2000
IEEE
15 years 8 months ago
2000
IEEE
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...
150
Voted
ISSTA
2009
ACM
15 years 8 months ago
2009
ACM
This paper describes an approach for conformance testing of mobile and distributed systems. The approach is based on kiltera — a novel, high-level language supporting the descri...
160
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PTS
2003
15 years 5 months ago
2003
UML models focus primarily on the definition of system structure and behaviour, but provide only limited means for describing test objectives and test procedures. However, with the...