4299 search results - page 224 / 860 » Concurrent Test Generation |
135
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CODES
2008
IEEE
15 years 5 months ago
2008
IEEE
Functional validation is a major bottleneck in microprocessor design methodology. Simulation is the widely used method for functional validation using billions of random and biase...
131
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DBSEC
2008
15 years 5 months ago
2008
Abstract. Many security problems only become apparent after software is deployed, and in many cases a failure has occurred prior to the awareness of the problem. Although many woul...
162
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ICST
2009
IEEE
15 years 1 months ago
2009
IEEE
This paper studies the problem of model-based testing of real-time systems that are only partially observable. We model the System Under Test (SUT) using Timed Game Automata (TGA)...
127
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ATS
2003
IEEE
15 years 9 months ago
2003
IEEE
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...
129
Voted
ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
As the performance of Analog-to-Digital Converters continues to improve, it is becoming more challenging and costly to develop sufficiently fast and low-drift signal generators th...