4299 search results - page 237 / 860 » Concurrent Test Generation |
153
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VTS
2008
IEEE
15 years 10 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
156
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ACSAC
2007
IEEE
15 years 10 months ago
2007
IEEE
With the recent rapid increase in interactive web applications that employ back-end database services, an SQL injection attack has become one of the most serious security threats....
140
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UM
2007
Springer
15 years 10 months ago
2007
Springer
: SimStudent is a machine-learning agent that learns cognitive skills by demonstration. It was originally developed as a building block of the Cognitive Tutor Authoring Tools (CTAT...
146
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NDSS
2008
IEEE
15 years 10 months ago
2008
IEEE
Fuzz testing is an effective technique for finding security vulnerabilities in software. Traditionally, fuzz testing tools apply random mutations to well-formed inputs of a progr...
113
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...