4299 search results - page 246 / 860 » Concurrent Test Generation |
126
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ITC
2000
IEEE
15 years 7 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
133
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EVOW
2006
Springer
15 years 7 months ago
2006
Springer
Abstract. We motivate and describe an analog evolvable hardware design platform named GRACE (i.e. Generative Robust Analog Circuit Exploration). GRACE combines coarse-grained, topo...
154
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COLING
2010
14 years 11 months ago
2010
This paper investigates the use and the prediction potential of semantic similarity measures for automatic generation of links across different documents and passages. First, the ...
117
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SAS
2000
Springer
15 years 7 months ago
2000
Springer
Computing invariants is the key issue in the analysis of infinite-state systems whether analysis means testing, verification or parameter synthesis. In particular, methods that all...
128
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ICASSP
2011
IEEE
14 years 7 months ago
2011
IEEE
F0 is an acoustic feature that varies largely from one speaker to another. F0 is characterized by a discontinuity in the transition between voiced and unvoiced sounds that present...