4299 search results - page 247 / 860 » Concurrent Test Generation |
125
Voted
DELTA
2008
IEEE
15 years 10 months ago
2008
IEEE
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...
139
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ICRA
2006
IEEE
15 years 10 months ago
2006
IEEE
Abstract— This paper describes the online generation of trajectories for omnidirectional walking on two legs. The gait can be parameterized using walking direction, walking speed...
147
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KI
2004
Springer
15 years 9 months ago
2004
Springer
This paper proposes a new corpus-based approach for deriving syntactic structures and generating parse trees of natural language sentences. The parts of speech (word categories) of...
158
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CCS
2006
ACM
15 years 8 months ago
2006
ACM
This paper presents EXE, an effective bug-finding tool that automatically generates inputs that crash real code. Instead of running code on manually or randomly constructed input,...
139
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AMI
2008
Springer
15 years 6 months ago
2008
Springer
To improve the performance and wellbeing of humans in complex human-computer interaction settings, an interesting challenge for an ambient (or pervasive) agent system is to recogni...