4299 search results - page 257 / 860 » Concurrent Test Generation |
122
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FATES
2004
Springer
15 years 9 months ago
2004
Springer
We present the development of T-UPPAAL — a new tool for online black-box testing of real-time embedded systems from non-deterministic timed automata specifications. It is based ...
116
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ISCAS
2003
IEEE
15 years 9 months ago
2003
IEEE
A deterministic dynamic element matching (DEM) approach to ADC testing is introduced and compared with a common random DEM method. With both approaches, a highly non-ideal DAC is ...
142
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IPPS
1998
IEEE
15 years 8 months ago
1998
IEEE
We propose a periodic diagnostic algorithm based on the testing model of computation for real-time systems. The diagnostic task runs on every processor of the system. When the task...
129
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GECCO
2008
Springer
15 years 5 months ago
2008
Springer
There has been little attention to search based test data generation in the presence of pointer inputs and dynamic data structures, an area in which recent concolic methods have e...
149
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ERSA
2010
15 years 2 months ago
2010
SRAM-based FPGA devices are an attractive option for data processing on space-based platforms, due to high computational capabilities and a lower power envelope than traditional pr...