4299 search results - page 259 / 860 » Concurrent Test Generation |
140
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VTS
2002
IEEE
15 years 9 months ago
2002
IEEE
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is diffic...
144
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CISSE
2008
Springer
15 years 6 months ago
2008
Springer
According to the software engineering perspective, grammars can be viewed as "Specifications for defining languages or compilers". They form the basics of languages and ...
129
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ICPPW
2009
IEEE
15 years 11 months ago
2009
IEEE
—The increasing attention on global scheduling algorithms for identical multiprocessor platforms produced different, independently developed, schedulability tests. However, the e...
132
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ETS
2006
IEEE
15 years 10 months ago
2006
IEEE
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...
146
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AMOST
2005
ACM
15 years 9 months ago
2005
ACM
The combinatorial approach to software testing uses models to generate a minimal number of test inputs so that selected combinations of input values are covered. The most common c...