4299 search results - page 286 / 860 » Concurrent Test Generation |
143
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DATE
2002
IEEE
15 years 9 months ago
2002
IEEE
System-on-chip (SOC) design methodology is becoming the trend in the IC industry. Integrating reusable cores from multiple sources is essential in SOC design, and different design...
131
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ISSRE
2002
IEEE
15 years 9 months ago
2002
IEEE
Spreadsheet languages are widely used by a variety of end users to perform many important tasks. Despite their perceived simplicity, spreadsheets often contain faults. Furthermore...
108
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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
Abstract— This paper discusses the generation of informationrich, arbitrarily-large synthetic data sets which can be used to (a) efficiently learn tests that correlate a set of ...
129
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DATE
2008
IEEE
15 years 11 months ago
2008
IEEE
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...
132
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ISSTA
2006
ACM
15 years 10 months ago
2006
ACM
In black-box testing, one is interested in creating a suite of tests from requirements that adequately exercise the behavior of a software system without regard to the internal st...