4299 search results - page 298 / 860 » Concurrent Test Generation |
121
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ISSTA
2010
ACM
15 years 8 months ago
2010
ACM
The output of a disassembler is used for many different purposes (e.g., debugging and reverse engineering). Therefore, disassemblers represent the first link of a long chain of s...
181
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CSREAESA
2008
15 years 6 months ago
2008
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
125
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IJOE
2007
15 years 4 months ago
2007
: An environment targeted to e-learning is presented for teaching design and test of electronic systems. The environment consists of a set of Java applets, and of web based access ...
158
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ISOLA
2010
Springer
15 years 3 months ago
2010
Springer
Abstract. This article deals with performance verifications of architecture models of real-time embedded systems. We focus on models verified with the real-time scheduling theory...
137
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ICCAD
2010
IEEE
15 years 1 months ago
2010
IEEE
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...