4299 search results - page 299 / 860 » Concurrent Test Generation |
151
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ICCAD
2003
IEEE
15 years 9 months ago
2003
IEEE
The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...
123
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DATE
2002
IEEE
15 years 9 months ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
141
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ATS
2000
IEEE
15 years 9 months ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...
118
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ISSRE
2000
IEEE
15 years 9 months ago
2000
IEEE
The behavior of nondeterminate systems can be hard to predict, since similar inputs at different times can generate different outputs. In other words, the behavior seen during tes...
144
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IJCAI
2007
15 years 6 months ago
2007
Traditional classification involves building a classifier using labeled training examples from a set of predefined classes and then applying the classifier to classify test instan...