4299 search results - page 312 / 860 » Concurrent Test Generation |
141
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DAC
1994
ACM
15 years 8 months ago
1994
ACM
A powerful combinational path sensitization engine is required for the efficient implementation of tools for test pattern generation, timing analysis, and delay fault testing. Path...
145
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CONCURRENCY
2006
15 years 4 months ago
2006
: The next generation of scientific experiments and studies, popularly called e-Science, is carried out by large collaborations of researchers distributed around the world engaged ...
129
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ICCAD
2000
IEEE
15 years 9 months ago
2000
IEEE
computation and automatic abstraction. Second, Ketchum performs not only automatic test generation but also unreachability analysis, which enables the test generation effort to be ...
133
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ASPDAC
2006
ACM
15 years 8 months ago
2006
ACM
The verification of modern computing systems has grown to dominate the cost of system design, often with limited success as designs continue to be released with latent bugs. This t...
172
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ASWEC
2004
IEEE
15 years 8 months ago
2004
IEEE
Assessing the likely run-time performance of applications using thin-client architectures during their design is very difficult. We describe SoftArch/Thin, a thin-client test-bed ...