4299 search results - page 323 / 860 » Concurrent Test Generation |
152
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SEW
2007
IEEE
15 years 11 months ago
2007
IEEE
: After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and...
139
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CONSTRAINTS
2007
15 years 4 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
128
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FLAIRS
1998
15 years 6 months ago
1998
Providing assurances of performance is an important aspect of successful development and commercialization of expert systems. However, this can only be done if the quality of the ...
181
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INFSOF
2011
14 years 11 months ago
2011
Context: Service Oriented Architectures (SOA) have emerged as a new paradigm to develop interoperable and highly dynamic applications. Objective: This paper aims to identify the s...
149
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ICCV
2005
IEEE
16 years 6 months ago
2005
IEEE
We have developed a two-phase generative / discriminative learning procedure for the recognition of classes of objects and concepts in outdoor scenes. Our method uses both multipl...