4299 search results - page 324 / 860 » Concurrent Test Generation |
127
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VLSID
2007
IEEE
16 years 5 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...
121
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ICN
2005
Springer
15 years 10 months ago
2005
Springer
Abstract. This paper considers the primary and secondary path generation problem in traffic engineering. We first present a standard MILP model. Since its size and integrality gap...
140
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GLVLSI
2009
IEEE
15 years 8 months ago
2009
IEEE
1 Soft errors caused by cosmic particles and radiation emitted by the packaging are an important problem in contemporary microprocessors. Parity bits are used to detect single bit ...
167
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CHES
2006
Springer
15 years 8 months ago
2006
Springer
The generation of prime numbers underlies the use of most public-key cryptosystems, essentially as a primitive needed for the creation of RSA key pairs. Surprisingly enough, despit...
124
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ISHPC
2000
Springer
15 years 8 months ago
2000
Springer
Isosurface generation algorithms usually need a vertex-identification process since most of polygon-vertices of an isosurface are shared by several polygons. In our observation the...