4299 search results - page 327 / 860 » Concurrent Test Generation |
182
click to vote
ICPR
2008
IEEE
16 years 6 months ago
2008
IEEE
Usually, performance of classifiers is evaluated on real-world problems that mainly belong to public repositories. However, we ignore the inherent properties of these data and how...
133
click to vote
DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
Abstract—The generation of device drivers is a very time consuming and error prone activity. All the strategies proposed up to now to simplify this operation require a manual, ev...
142
click to vote
ICST
2009
IEEE
15 years 11 months ago
2009
IEEE
Java PathFinder (JPF) is a popular model checker for Java programs. JPF was used to generate object graphs as test inputs for object-oriented programs. Specifically, JPF was used...
132
click to vote
EVOW
2007
Springer
15 years 11 months ago
2007
Springer
Many instances of NP-hard problems can be solved efficiently if the treewidth of their corresponding graph is small. Finding the optimal tree decompositions is an NP-hard problem a...
137
click to vote
3DGIS
2006
Springer
15 years 10 months ago
2006
Springer
Abstract Three-dimensional (3D) building model is one of the most important components in a cyber city implementation and application. This study developed an effective and highly ...