4299 search results - page 355 / 860 » Concurrent Test Generation |
138
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NIPS
2000
15 years 6 months ago
2000
The product of experts learning procedure [1] can discover a set of stochastic binary features that constitute a non-linear generative model of handwritten images of digits. The q...
132
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EMSOFT
2008
Springer
15 years 6 months ago
2008
Springer
C's volatile qualifier is intended to provide a reliable link between operations at the source-code level and operations at the memorysystem level. We tested thirteen product...
142
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DSD
2006
IEEE
15 years 11 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
141
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
125
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JSS
2010
15 years 3 months ago
2010
Automated test data generation has remained a topic of considerable interest for several decades because it lies at the heart of attempts to automate the process of Software Testi...