4299 search results - page 357 / 860 » Concurrent Test Generation |
144
Voted
SPIN
2000
Springer
15 years 8 months ago
2000
Springer
This paper describes how two runtime analysis algorithms, an existing data race detection algorithm and a new deadlock detection algorithm, have been implemented to analyze Java pr...
129
Voted
DATE
2008
IEEE
15 years 11 months ago
2008
IEEE
This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for th...
175
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ATS
2002
IEEE
15 years 10 months ago
2002
IEEE
In this paper, we present a technique for reducing the test length of counter-based pseudo-exhaustive built-in self-testing (BIST) based on width compression method. More formally...
160
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DAWAK
2006
Springer
15 years 8 months ago
2006
Springer
In the paper, a new evolutionary algorithm (EA) for mixed tree learning is proposed. In non-terminal nodes of a mixed decision tree different types of tests can be placed, ranging ...
140
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KBSE
2000
IEEE
15 years 8 months ago
2000
IEEE
Testing has a vital support role in the software engineering process, but developing tests often takes significant resources. A formal specification is a repository of knowledge a...