4299 search results - page 362 / 860 » Concurrent Test Generation |
154
click to vote
ASPLOS
2011
ACM
14 years 8 months ago
2011
ACM
Transactional memory (TM) is a promising synchronization mechanism for the next generation of multicore processors. Best-effort Hardware Transactional Memory (HTM) designs, such a...
159
Voted
ET
2010
15 years 2 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
203
Voted
PLDI
2011
ACM
14 years 7 months ago
2011
ACM
Compilers should be correct. To improve the quality of C compilers, we created Csmith, a randomized test-case generation tool, and spent three years using it to find compiler bug...
112
Voted
CDES
2006
15 years 6 months ago
2006
In this paper we define communicating distributed H systems with simple splicing rules of types (1,3), (1,4) and (2,3) and study the generative capacity. keyword: Splicing systems,...
138
click to vote
ESANN
2003
15 years 6 months ago
2003
- A test bed of experiments with real and artificially generated data has been designed to compare the performance of three well-known algorithms for BSS. The main goal of these ex...