4299 search results - page 364 / 860 » Concurrent Test Generation |
128
Voted
DATE
2003
IEEE
15 years 10 months ago
2003
IEEE
Built-In Self-Test (BIST) becomes important also for more complex structures like complete front-ends. In order to bring down the costs for the test overhead, Spectral Signature A...
129
Voted
SIGCSE
2000
ACM
15 years 9 months ago
2000
ACM
We describe a Web-based interactive system, called PILOT, for testing computer science concepts. The strengths of PILOT are its universal access and platform independence, its use...
132
click to vote
HASKELL
2007
ACM
15 years 8 months ago
2007
ACM
We describe the design, implementation and use of HPC, a toolkit to record and display Haskell Program Coverage. HPC includes tools that instrument Haskell programs to record prog...
129
click to vote
ITC
1997
IEEE
15 years 8 months ago
1997
IEEE
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
139
Voted
PRL
1998
15 years 4 months ago
1998
A single parameter value that represents the difference between the original and the digitized characters is determined from a binary scan of a test chart. It represents the combi...