4299 search results - page 375 / 860 » Concurrent Test Generation |
136
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SIGSOFT
1993
ACM
15 years 9 months ago
1993
ACM
1 Many software libraries (e.g., the Booch C++ Components, libg++, NIHCL, COOL) provide components (classes) that implement data structures. Each component is written by hand and r...
153
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SAC
2010
ACM
15 years 6 months ago
2010
ACM
The control flow of common processors does not match the specific needs of reactive systems. Key issues for these systems are preemption and concurrency, combined with timing pred...
140
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CG
2006
Springer
15 years 5 months ago
2006
Springer
In most previous NPR line rendering systems, geometric properties have been directly used to extract and stylize certain edges. However, this approach is bound to a tight stylizat...
149
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DT
2000
15 years 4 months ago
2000
Effective high-level ATPG tools are increasingly needed, as an essential element in the quest for reducing as much as possible the designer work on gate-level descriptions. We pro...
166
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ICCAD
1995
IEEE
15 years 8 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...