4299 search results - page 379 / 860 » Concurrent Test Generation |
118
Voted
ITC
1999
IEEE
15 years 9 months ago
1999
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
170
click to vote
IANDC
2006
15 years 5 months ago
2006
Probabilistic verification of continuous-time stochastic processes has received increasing attention in the model-checking community in the past five years, with a clear focus on ...
173
Voted
ICST
2010
IEEE
15 years 3 months ago
2010
IEEE
Mobile computing systems provide new challenges for verification. One of them is the dynamicity of the system structure, with mobility-induced connections and disconnections, dynam...
137
click to vote
ICCAD
2005
IEEE
16 years 1 months ago
2005
IEEE
Future inter- and intra-ULSI interconnect systems demand extremely high data rates as well as bi-directional multi-I/O concurrent service, re-configurable computing/processing arc...
124
click to vote
DCOSS
2009
Springer
15 years 11 months ago
2009
Springer
A new generation of ultra wideband (UWB) communication transceivers are becoming available which support both positioning and communication tasks. Transceiver manufacturers envisio...