4299 search results - page 389 / 860 » Concurrent Test Generation |
136
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VLSID
2004
IEEE
16 years 5 months ago
2004
IEEE
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...
146
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SAC
2004
ACM
15 years 10 months ago
2004
ACM
Web applications have become complex and crucial for many firms, especially when combined with areas such as CRM (Customer Relationship Management) and BPR (Business Process Reen...
118
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DATE
2007
IEEE
15 years 11 months ago
2007
IEEE
Errors in timing closure process during the physical design stage may result in systematic silicon failures, such as scan chain hold time violations, which prohibit the test of ma...
144
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ISSTA
2006
ACM
15 years 11 months ago
2006
ACM
DSD-Crasher is a bug finding tool that follows a three-step approach to program analysis: D. Capture the program’s intended execution behavior with dynamic invariant detection....
160
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SIGMOD
2000
ACM
15 years 9 months ago
2000
ACM
Testing an SQL database system by running large sets of deterministic or stochastic SQL statements is common practice in commercial database development. However, code defects oft...