4299 search results - page 401 / 860 » Concurrent Test Generation |
174
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FSTTCS
1998
Springer
15 years 9 months ago
1998
Springer
Abstract. We propose a construction that augments the precomputation step of a regular tree pattern matching algorithm to include cost analysis. The matching device generated is a ...
133
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USENIX
2008
15 years 8 months ago
2008
We present a novel method for diagnosing configuration management errors. Our proposed approach deduces the state of a buggy computer by running predicates that test system correc...
160
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INFORMATICASI
2010
15 years 3 months ago
2010
Recognizing attack plans is one of the goals of security analysts. Attack plan recognition is critical for predicting future actions of attackers, generating possible actions (i.e...
137
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ATS
2009
IEEE
16 years 29 days ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
185
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DATE
2008
IEEE
16 years 18 days ago
2008
IEEE
Abstract— We present a general method to evaluate RF BuiltIn Self-Test (BIST) techniques during the design stage. In particular, the adaptive kernel estimator is used to construc...