4299 search results - page 403 / 860 » Concurrent Test Generation |
167
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VTS
2000
IEEE
15 years 10 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
157
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ECOOP
1997
Springer
15 years 10 months ago
1997
Springer
A type inclusion test is a procedure to decide whether two types are related by a given subtyping relationship. An efficient implementation of the type inclusion test plays an impo...
193
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SRDS
1993
IEEE
15 years 10 months ago
1993
IEEE
We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bay...
186
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ITC
1994
IEEE
15 years 10 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
137
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APLAS
2008
ACM
15 years 8 months ago
2008
ACM
Abstract. We study the problem of generating a test sequence that achieves maximal coverage for a reactive system under test. We formulate the problem as a repeated game between th...