4299 search results - page 405 / 860 » Concurrent Test Generation |
182
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PLDI
2009
ACM
16 years 29 days ago
2009
ACM
Data races are one of the most common and subtle causes of pernicious concurrency bugs. Static techniques for preventing data races are overly conservative and do not scale well t...
155
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PPPJ
2009
ACM
16 years 29 days ago
2009
ACM
Repository-based revision control systems such as CVS, RCS, Subversion, and GIT, are extremely useful tools that enable software developers to concurrently modify source code, man...
156
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SENSYS
2009
ACM
16 years 29 days ago
2009
ACM
Network protocols are typically designed and tested individually. In practice, however, applications use multiple protocols concurrently. This discrepancy can lead to failures fro...
196
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CCECE
2006
IEEE
16 years 6 days ago
2006
IEEE
Real Time embedded system designers are facing extreme challenges in underlying architectural design selection. It involves the selection of a programmable, concurrent, heterogene...
162
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ICDCS
2010
IEEE
15 years 10 months ago
2010
IEEE
—Wireless Sensor Network (WSN) applications are typically event-driven. While the source codes of these applications may look simple, they are executed with a complicated concurr...