Sciweavers

4299 search results - page 418 / 860
» Concurrent Test Generation
Sort
View
DAC
2011
ACM
14 years 6 months ago
Image quality aware metrics for performance specification of ADC array in 3D CMOS imagers
A three-dimensional (3D) CMOS imager constructed from stacking a pixel array of image sensors, an analog-to-digital converter (ADC) array, and an image signal processor (ISP) arra...
Hsiu-Ming Chang, Kwang-Ting (Tim) Cheng
TACAS
2012
Springer
277views Algorithms» more  TACAS 2012»
14 years 1 months ago
Proving Reachability Using FShell - (Competition Contribution)
FShell is an automated white-box test-input generator for C programs, computing test data with respect to user-specified code coverage criteria. The pillars of FShell are the decl...
Andreas Holzer, Daniel Kroening, Christian Schallh...
ICIP
2009
IEEE
16 years 7 months ago
Image Tamper Detection Based On Demosaicing Artifacts
In this paper, we introduce tamper detection techniques based on artifacts created by Color Filter Array (CFA) processing in most digital cameras. The techniques are based on comp...
ICCD
2008
IEEE
221views Hardware» more  ICCD 2008»
16 years 3 months ago
Reversi: Post-silicon validation system for modern microprocessors
— Verification remains an integral and crucial phase of today’s microprocessor design and manufacturing process. Unfortunately, with soaring design complexities and decreasing...
Ilya Wagner, Valeria Bertacco
ICASSP
2009
IEEE
16 years 1 months ago
Optimizing segment label boundaries for statistical speech synthesis
This paper introduces a new optimization technique for moving segment labels (phone and subphonetic) to optimize statistical parametric speech synthesis models. The choice of obje...
Alan W. Black, John Kominek