4299 search results - page 423 / 860 » Concurrent Test Generation |
152
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ITC
1996
IEEE
15 years 10 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
151
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LREC
2010
15 years 7 months ago
2010
This paper describes the first TTS evaluation campaign designed for Spanish. Seven research institutions took part in the evaluation campaign and developed a voice from a common s...
134
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IICAI
2007
15 years 7 months ago
2007
Abstract. This paper describes a tool for extracting multi-word number expressions, calculating their numerical values, and then generating them into another language, thus transla...
155
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TCAD
2002
15 years 6 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
278
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ICDE
2007
IEEE
16 years 7 months ago
2007
IEEE
requirement. Furthermore, programming using sequence constructs normally produce nested structures and The current approachfor modeling synchronization in scattered code, especiall...