4299 search results - page 437 / 860 » Concurrent Test Generation |
130
Voted
ISCA
2006
IEEE
16 years 10 days ago
2006
IEEE
One of the key challenges for high-density servers (e.g., blades) is the increased costs in addressing the power and heat density associated with compaction. Prior approaches have...
166
click to vote
ASPDAC
2006
ACM
16 years 9 days ago
2006
ACM
- This paper presents a DSP core for multi-core media SoC, which is optimized to execute a set of signal processing tasks very efficiently. The fully-programmable core has a data-c...
154
click to vote
ACSAC
2005
IEEE
15 years 12 months ago
2005
IEEE
It is a well known problem that the attack recovery of a self-healing system rolls back not only malicious transactions, but also legitimate transactions that are dependent on the...
157
click to vote
VTS
2005
IEEE
15 years 12 months ago
2005
IEEE
Nanometer circuits are highly susceptible to soft errors generated by alpha-particle or atmospheric neutron strikes to circuit nodes. The reasons for the high susceptibility are t...
162
click to vote
CHARME
2005
Springer
15 years 12 months ago
2005
Springer
Abstract. We propose a new saturation-based symbolic state-space generation algorithm for finite discrete-state systems. Based on the structure of the high-level model specificat...