4299 search results - page 449 / 860 » Concurrent Test Generation |
175
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ICML
2008
IEEE
16 years 7 months ago
2008
IEEE
In inductive logic programming, subsumption is a widely used coverage test. Unfortunately, testing -subsumption is NP-complete, which represents a crucial efficiency bottleneck fo...
155
Voted
PERCOM
2009
ACM
16 years 6 months ago
2009
ACM
Abstract--Pervasive computing applications involve both software concerns, like any software system, and integration concerns, for the constituent networked devices of the pervasiv...
135
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VLSID
2002
IEEE
16 years 6 months ago
2002
IEEE
We propose the redundancy identification of wire replacement faults. The solutions rely on the satisfiability (SAT) formulation of redundancy identification, augmented with the me...
164
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DCC
2006
IEEE
16 years 5 months ago
2006
IEEE
A covering array CA(N; t, k, v) is an N ? k array such that every N ? t sub-array contains all t-tuples from v symbols at least once, where t is the strength of the array. Coverin...
152
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ALT
2005
Springer
16 years 3 months ago
2005
Springer
This paper deals with an unusual phenomenon where most machine learning algorithms yield good performance on the training set but systematically worse than random performance on th...