4299 search results - page 452 / 860 » Concurrent Test Generation |
151
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ISSRE
2003
IEEE
15 years 11 months ago
2003
IEEE
A large number of coverage criteria to generate tests from logical expressions have been proposed. Although there have been large variations in the terminology, the articulation o...
144
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WETICE
2003
IEEE
15 years 11 months ago
2003
IEEE
The ability of worms to spread at rates that effectively preclude human-directed reaction has elevated them to a first-class security threat to distributed systems. We present th...
162
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GECCO
2003
Springer
15 years 11 months ago
2003
Springer
Learning Bayesian networks from data has been studied extensively in the evolutionary algorithm communities [Larranaga96, Wong99]. We have previously explored extending some of the...
140
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DAC
2000
ACM
15 years 10 months ago
2000
ACM
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the trad...
168
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ICALP
1998
Springer
15 years 10 months ago
1998
Springer
We generate a natural hierarchy of equivalences for asynchronous name-passing process calculi from simple variations on Milner and Sangiorgi's definition of weak barbed bisim...