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DSN
2009
IEEE
15 years 11 months ago
LFI: A practical and general library-level fault injector
Fault injection, a critical aspect of testing robust systems, is often overlooked in the development of generalpurpose software. We believe this is due to the absence of easy-to-u...
Paul Dan Marinescu, George Candea
129
Voted
DATE
2008
IEEE
121views Hardware» more  DATE 2008»
15 years 11 months ago
A Bridging Fault Model Where Undetectable Faults Imply Logic Redundancy
We define a robust fault model as a model where the existence of an undetectable fault implies the existence of logic redundancy, or more generally, a suboptimality in the synthe...
Irith Pomeranz, Sudhakar M. Reddy
DATE
2008
IEEE
174views Hardware» more  DATE 2008»
15 years 11 months ago
Calibration of Integrated CMOS Hall Sensors Using Coil-on-Chip in ATE Environment
Due to high demand for hall sensors mostly in the automotive and industrial applications, development and manufacturing of hall sensors in System-on-Chip (SoC) became more importa...
Mustafa Badaroglu, Guy Decabooter, Francois Laulan...
SMI
2008
IEEE
139views Image Analysis» more  SMI 2008»
15 years 11 months ago
Noise in 3D laser range scanner data
This paper discusses noise in range data measured by a Konica Minolta Vivid 910 scanner. Previous papers considering denoising 3D mesh data have often used artificial data compri...
Xianfang Sun, Paul L. Rosin, Ralph R. Martin, Fran...
VTS
2008
IEEE
119views Hardware» more  VTS 2008»
15 years 11 months ago
Error Sequence Analysis
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
Jaekwang Lee, Intaik Park, Edward J. McCluskey