4299 search results - page 494 / 860 » Concurrent Test Generation |
164
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MEMOCODE
2007
IEEE
15 years 11 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
154
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WORDS
2005
IEEE
15 years 10 months ago
2005
IEEE
Major computer companies and government agencies are adopting Web Services (WS) technology. Web services must ensure interoperability and security, and be reliable and trustworthy...
133
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APGV
2005
ACM
15 years 10 months ago
2005
ACM
In this paper we describe an experiment to obtain information about the perceptual potential of the human visual system regarding shadow perception. Shadows play an important part...
119
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SAC
2005
ACM
15 years 10 months ago
2005
ACM
This paper addresses single and multiple container loading problems. We propose to use dynamic prioritization to handle awkward box types. The box type with a higher priority will...
189
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ANTSW
2004
Springer
15 years 10 months ago
2004
Springer
A general-purpose, simulation-based algorithm S-ACO for solving stochastic combinatorial optimization problems by means of the ant colony optimization (ACO) paradigm is investigate...