4299 search results - page 528 / 860 » Concurrent Test Generation |
141
Voted
HICSS
2003
IEEE
15 years 10 months ago
2003
IEEE
The discovery of sequential patterns, which extends beyond frequent item-set finding of association rule mining, has become a challenging task due to its complexity. Essentially, ...
160
Voted
BIRTHDAY
2003
Springer
15 years 9 months ago
2003
Springer
Abstract: In the automotive and aerospace industry, millions of technical documents are generated during the development of complex engineering products. Particularly, the universa...
149
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
—Multi-Processor System-on-Chips (MPSoCs) exploit task-level parallelism to achieve high computation throughput, but concurrent memory accesses from multiple PEs may cause memory...
150
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CLOUD
2010
ACM
15 years 9 months ago
2010
ACM
Cloud computing has emerged as a preferred platform for deploying scalable web-applications. With the growing scale of these applications and the data associated with them, scalab...
137
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PLDI
2010
ACM
15 years 9 months ago
2010
ACM
Dynamic correctness checking tools (a.k.a. lifeguards) can detect a wide array of correctness issues, such as memory, security, and concurrency misbehavior, in unmodified executa...