4299 search results - page 546 / 860 » Concurrent Test Generation |
164
click to vote
PATMOS
2000
Springer
15 years 8 months ago
2000
Springer
Abstract. Reduction of chip packaging and cooling costs for deep sub-micron SystemOn-Chip (SOC) designs is an emerging issue. We present a simulation-based methodology able to real...
167
click to vote
RAID
2000
Springer
15 years 8 months ago
2000
Springer
Abstract. Eight sites participated in the second DARPA off-line intrusion detection evaluation in 1999. Three weeks of training and two weeks of test data were generated on a test ...
148
click to vote
DAC
2010
ACM
15 years 7 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
158
click to vote
AIPS
2008
15 years 6 months ago
2008
As no plan can cover all possible contingencies, the ability to detect failures during plan execution is crucial to the robustness of any autonomous system operating in a dynamic ...
134
click to vote
AI
2008
Springer
15 years 6 months ago
2008
Springer
Abstract. The purpose of this paper is to test the hypothesis that simple classifiers are more robust to changing environments than complex ones. We propose a strategy for generati...