4299 search results - page 55 / 860 » Concurrent Test Generation |
148
click to vote
ITC
1993
IEEE
15 years 7 months ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
122
click to vote
VLSID
2002
IEEE
16 years 3 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
167
click to vote
GLVLSI
2009
IEEE
15 years 26 days ago
2009
IEEE
To assist in dynamic assertion-based verification, we present a method to automatically build a test vector generator from a temporal property. Based on the duality between monito...
133
click to vote
IWANN
2009
Springer
15 years 9 months ago
2009
Springer
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
152
click to vote
ICST
2009
IEEE
15 years 25 days ago
2009
IEEE
Under certain constraints the test case generation problem can be represented as a model checking problem, thus enabling the use of powerful model checking tools to perform the te...