4299 search results - page 562 / 860 » Concurrent Test Generation |
150
click to vote
ICPR
2008
IEEE
15 years 11 months ago
2008
IEEE
In this paper, we present a new tone mapping algorithm for the display of high dynamic range images, inspired by adaptive process of the human visual system. The proposed algorith...
110
click to vote
ICRA
2008
IEEE
15 years 11 months ago
2008
IEEE
— In this paper, we propose a new approach for computing force-closure grasps of two-dimensional and threedimensional objects. Assuming n hard-finger contact with Coulomb fricti...
147
click to vote
ICTAI
2008
IEEE
15 years 10 months ago
2008
IEEE
This paper delves into the problem of face recognition using color as an important cue in improving the accuracy of recognition. To perform recognition of color images, we use the...
146
click to vote
IOLTS
2008
IEEE
15 years 10 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
130
click to vote
IROS
2008
IEEE
15 years 10 months ago
2008
IEEE
Abstract— Path deformation is a technique that was introduced to generate robot motion wherein a path, that has been computed beforehand, is continuously deformed on-line in resp...