4299 search results - page 564 / 860 » Concurrent Test Generation |
114
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DSD
2007
IEEE
15 years 10 months ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
139
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GLVLSI
2007
IEEE
15 years 10 months ago
2007
IEEE
A special logic synthesis problem is considered for Boolean functions which have large don’t care sets and are irregular. Here, a function is considered as irregular if the inpu...
152
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ICCTA
2007
IEEE
15 years 10 months ago
2007
IEEE
During MR imaging, the image of the object may get deformed due to the slope between the MR probe and the object. It is in general undesirable, particularly for 3D imaging. In thi...
138
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ICRA
2007
IEEE
15 years 10 months ago
2007
IEEE
—This paper presents technology for performing autonomous commanding of a planetary rover. Through the use of AI planning, scheduling and execution techniques, the OASIS autonomo...
125
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AIIA
2007
Springer
15 years 10 months ago
2007
Springer
A 3D virtual model of the human lower extremity has been developed for the purpose of examining how the neuromuscular system controls the muscles and generates the desired movement...