4299 search results - page 586 / 860 » Concurrent Test Generation |
157
Voted
ASAP
2006
IEEE
15 years 8 months ago
2006
IEEE
Low Density Parity Check (LDPC) codes are one of the best error correcting codes that enable the future generations of wireless devices to achieve higher data rates. This paper pr...
115
Voted
CLEF
2004
Springer
15 years 8 months ago
2004
Springer
The main goal of the bilingual and monolingual participation of the MIRACLE team at CLEF 2004 was testing the effect of combination approaches to information retrieval. The starti...
120
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AUSAI
2006
Springer
15 years 8 months ago
2006
Springer
Attribute subsetting is a meta-classification technique, based on learning multiple base-level classifiers on projections of the training data. In prior work with nearest-neighbour...
165
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FGR
2004
IEEE
15 years 8 months ago
2004
IEEE
This paper presents a complete face authentication system integrating 2D intensity and 3D range data, based on a low-cost, real-time structured light sensor. Novel algorithms are ...
137
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IDEAL
2000
Springer
15 years 7 months ago
2000
Springer
Abstract. Ordinal data play an important part in financial forecasting. For example, advice from expert sources may take the form of "bullish", "bearish" or &qu...