4299 search results - page 97 / 860 » Concurrent Test Generation |
108
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GECCO
2007
Springer
15 years 9 months ago
2007
Springer
There has been a considerable body of work on search–based test data generation for branch coverage. However, hitherto, there has been no work on multi–objective branch covera...
133
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ETS
2009
IEEE
15 years 1 months ago
2009
IEEE
We optimize the full-response diagnostic fault dictionary from a given test set. The smallest set of vectors is selected without loss of diagnostic resolution of the given test se...
134
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KBSE
2007
IEEE
15 years 9 months ago
2007
IEEE
We explore the automatic generation of test data that respect constraints expressed in the Object-Role Modeling (ORM) language. ORM is a popular conceptual modeling language, prim...
101
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ASPDAC
2006
ACM
15 years 9 months ago
2006
ACM
– An instruction set level reference model was developed for the development of synergistic processing unit (SPU) , which is one of the key components of the cell processor [1][2...
128
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IPPS
1998
IEEE
15 years 7 months ago
1998
IEEE
In this communication Simulated Annealing and Genetic Algorithms, are applied to the graph partitioning problem. These techniques mimic processes in statistical mechanics and biol...