4299 search results - page 98 / 860 » Concurrent Test Generation |
110
click to vote
VTS
1998
IEEE
15 years 7 months ago
1998
IEEE
This paper presents simulation evidence supporting the use of bit transition maximization techniques in the design of hardware test pattern generators TPGs. Bit transition maximiz...
122
click to vote
ICST
2010
IEEE
15 years 1 months ago
2010
IEEE
Abstract—In this paper we introduce Timed Moore Automata, a specification formalism which is used in industrial train control applications for specifying the real-time behavior ...
114
Voted
ISSRE
2007
IEEE
15 years 4 months ago
2007
IEEE
Model-checkers are powerful tools that can find individual traces through models to satisfy desired properties. These traces provide solutions to a number of problems. Instead of...
115
click to vote
ET
1998
15 years 3 months ago
1998
Defining information required by automatic test systems frequently involves a description of system behavior. To facilitate capturing the required behavior information in the cont...
138
click to vote
VLSID
2007
IEEE
16 years 3 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...