4299 search results - page 99 / 860 » Concurrent Test Generation |
145
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DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
This paper presents an infrastructure to test the functionality of the specific architectures output by a highlevel compiler targeting dynamically reconfigurable hardware. It resu...
114
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CORR
2004
Springer
15 years 3 months ago
2004
Springer
This paper describes the Patent Retrieval Task in the Fourth NTCIR Workshop, and the test collections produced in this task. We perform the invalidity search task, in which each p...
139
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EURODAC
1994
IEEE
15 years 7 months ago
1994
IEEE
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
142
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EDCC
2005
Springer
15 years 8 months ago
2005
Springer
Abstract. We present the PathCrawler prototype tool for the automatic generation of test-cases satisfying the rigorous all-paths criterion, with a user-defined limit on the number...
111
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OSDI
2008
ACM
16 years 3 months ago
2008
ACM
We present a new symbolic execution tool, KLEE, capable of automatically generating tests that achieve high coverage on a diverse set of complex and environmentally-intensive prog...